In the simplest case, the finite size of the AFM tip does not allow it to probe narrow, deep fissures in a sample where the tip radius is greater than the radius of the recess.Īlso, sharp sample features scanned with a dull tip are broadened in AFM images. Tip artifacts refer to either the occurrence of features or the absence of features in an image that are not in the sample, but due to the tip used as compared (hypothetically) with an ideal tip of near-zero tip radius. Tip ArtifactsĪtomic Force Microscope (AFM) images depend on the shape of the tip used to probe the sample. (However, even a blunt tip can resolve height accurately on a surface with shallow slopes.) Therefore, select a tip sharp enough to resolve the features of interest. Specifically, a tip cannot resolve the linear and angular aspects of any sample feature sharper than the tip itself. It is not useful to qualify a probe tip that is poorly matched to the sample to be imaged. Theoretical Foundation for Tip Qualification By using tip qualification to enforce tip acceptance criteria, metrological values can be compared from image to image, ensuring consistent, long-term comparability of samples. This feature can be used to check tips periodically for signs of wear, and to exchange unacceptably worn tips. Tip Qualification uses the tip estimate to determine whether the tip is acceptable for use. As this process is repeated for each local peak, any steeper slope than was found from all previously analyzed peaks causes the tip model to update to a new, sharper tip estimate. At each peak, the slope away from the peak in all directions is measured, determining the minimum tip sharpness (no data in the image can have a slope steeper than the slope of the tip). In Tip Estimation, local peaks in a topographic image are successively analyzed, refining a 3-dimensional tip model. A characterizer refers to a sample whose surface is well suited to deducing tip condition when imaged using an SPM probe. Tip Estimation generates a model of the tip based on an image of a standard characterizer sample. The Tip Qualification function incorporates the two separate capabilities: Tip Estimation and Tip Qualification. Tip Qualification refers to estimating tip shape from appropriate characterizer samples and rating tips as good, worn, bad, suspect, or no tip. You are here: NanoScope Software User Guide > Offline Commands > Analysis Functions > Tip Qualification Tip Qualification
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